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Proceedings Paper

Grating technology for topography measurement of curved surfaces
Author(s): Xiangqian Jiang; Tie-Bang Xie; Cai-Xian Yao; Zhu Li
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Paper Abstract

In this paper a new grating technology for topography measurement of the curved surface is described. It adopts a laser-grating interferometry sensing system whose standard depends on the RCHD grating constant. The optical principle and system characteristics are discussed in detail. The results of principle experiment are given. Key words: Topography measurement of curved surface laser-grating interferometry sensing system grating interferometry reflective cylindric holographic diffractive (RCHD) grating

Paper Details

Date Published: 22 September 1993
PDF: 4 pages
Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); doi: 10.1117/12.156502
Show Author Affiliations
Xiangqian Jiang, Huazhong Univ. of Science and Technology (China)
Tie-Bang Xie, Huazhong Univ. of Science and Technology (China)
Cai-Xian Yao, Huazhong Univ. of Science and Technology (China)
Zhu Li, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 2101:
Measurement Technology and Intelligent Instruments
Li Zhu, Editor(s)

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