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Proceedings Paper

Two-dimensional-SROP-1: optical profiler for surface-roughness measurement
Author(s): Chong Liu; Zhu Li; Jiabi Chen
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Paper Details

Date Published: 22 September 1993
PDF: 4 pages
Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); doi: 10.1117/12.156458
Show Author Affiliations
Chong Liu, Huazhong Univ. of Science and Technology (China)
Zhu Li, Huazhong Univ. of Science and Technology (China)
Jiabi Chen, Nanjing Normal Univ. (China)


Published in SPIE Proceedings Vol. 2101:
Measurement Technology and Intelligent Instruments

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