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Proceedings Paper

Control and self-diagnosis in uP-based measurement systems
Author(s): Ivan Kalchev
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Paper Abstract

This paper describes a new conception about self-diagnosis organization in the common structure in micro-processor (pP) based distributed systems. The article considers supplementary functions of typical supervisor programme and creates formal method for generating and accumulating of diagnostic information in regime of real time. The examined topic are self-removing short-lived random errors whose character is little continuation (parts of second). In extremal conditions namely for them (errors) is most probably to exchange into stable ones. It''s given a possibility for investigating the frequency of their appearance in connection with the external environmental factors.

Paper Details

Date Published: 22 September 1993
PDF: 6 pages
Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); doi: 10.1117/12.156452
Show Author Affiliations
Ivan Kalchev, Technical Univ. (Bulgaria)

Published in SPIE Proceedings Vol. 2101:
Measurement Technology and Intelligent Instruments
Li Zhu, Editor(s)

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