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Proceedings Paper

Research on multifunction measurement device by laser diffraction
Author(s): He Ma; Jian-Hua Yu; Cheng-Jun Wang; Hu-Chun Liu
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Paper Abstract

The measuring device by laser diffraction is described, It is used for measuring the Mean Spacing Sm of the Profile Irregularities, the Mean Spacing S of Local Peak of the Profile both are the parameters of the surface roughness standard, the feed rate f, the diameter of filament and the thickness of thin slice. Non-contact or on-line measurement could be realized by means of this device for measuring all parameters mentioned above (except thickness of thin slice). The device is characterized by adopting a diverging lens to expand the diffraction pattern, measuring and reading the separation of diffraction fringes using an electronic vernier calipers with numerical reading, thus reaching the purpose of measurement by means of lower precision electronic vernier calipers with numerical reading to deal with higher precision measurement.

Paper Details

Date Published: 22 September 1993
PDF: 4 pages
Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); doi: 10.1117/12.156372
Show Author Affiliations
He Ma, Fuxin Mining Institute (China)
Jian-Hua Yu, Fuxin Mining Institute (China)
Cheng-Jun Wang, Fuxin Mining Institute (China)
Hu-Chun Liu, Fuxin Mining Institute (China)


Published in SPIE Proceedings Vol. 2101:
Measurement Technology and Intelligent Instruments

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