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Proceedings Paper

Profile measurements using multi-gray-scale pattern projection
Author(s): Kiyoshi Takamasu; Tetuo Uekawa; Kazuhiko Kawakami; Shigeo Ozono; Ryosyuu Furutani
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Paper Abstract

A novel optical profile measurement system has been developed using the multi-gray scale pattern projection. In the profile measurements, the time series space coding projection method is faster method than the slit projection method, the laser beam scanning method and so on. We applied the multi-gray scale (4 gray levels) fringe pattern and the image processing hardware on the time series space coding to reduce the number of projections and to speed up the measuring time. The series of tests show that the multi-gray scale projection sensor reliably ensures the 3-D profile of the machine parts as small as 0.2 mm in the measuring range 100 mm within 0.6 sec. It can be applied to measure 3-D profiles and 3-D environments for the moving robots.

Paper Details

Date Published: 22 September 1993
PDF: 7 pages
Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); doi: 10.1117/12.156360
Show Author Affiliations
Kiyoshi Takamasu, Univ. of Tokyo (Japan)
Tetuo Uekawa, Univ. of Tokyo (Japan)
Kazuhiko Kawakami, Univ. of Tokyo (Japan)
Shigeo Ozono, Univ. of Tokyo (Japan)
Ryosyuu Furutani, Tokyo Denki Univ. (Japan)

Published in SPIE Proceedings Vol. 2101:
Measurement Technology and Intelligent Instruments
Li Zhu, Editor(s)

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