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Proceedings Paper

Analysis of the sensitivity and resolution of the spectrometer in the field
Author(s): Ben-He Jiang; Wenyi Chen; Yun-Qing Jiang; Sheng-Jun Du
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Paper Details

Date Published: 22 September 1993
PDF: 4 pages
Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); doi: 10.1117/12.156343
Show Author Affiliations
Ben-He Jiang, Shandong Univ. (China)
Wenyi Chen, Shandong Univ. (China)
Yun-Qing Jiang, Shandong Univ. (China)
Sheng-Jun Du, College of Shandong Architectural Engineering (China)

Published in SPIE Proceedings Vol. 2101:
Measurement Technology and Intelligent Instruments

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