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Proceedings Paper

New scheme of measuring roughness
Author(s): Ben-He Jiang; Wenyi Chen; Xue-Jin Liang; Sheng-Jun Du
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Paper Details

Date Published: 22 September 1993
PDF: 2 pages
Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); doi: 10.1117/12.156320
Show Author Affiliations
Ben-He Jiang, Shandong Univ. (China)
Wenyi Chen, Shandong Univ. (China)
Xue-Jin Liang, Shandong Univ. (China)
Sheng-Jun Du, College of Shandong Architectural Engineering (China)

Published in SPIE Proceedings Vol. 2101:
Measurement Technology and Intelligent Instruments

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