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Proceedings Paper

New reference line for estimating roughness of an arbitrary curved surface
Author(s): Shaojun Xiao; Xiangqian Jiang; Tie-Bang Xie
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Paper Details

Date Published: 22 September 1993
PDF: 5 pages
Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); doi: 10.1117/12.156319
Show Author Affiliations
Shaojun Xiao, Huazhong Univ. of Science and Technology (China)
Xiangqian Jiang, Huazhong Univ. of Science and Technology (China)
Tie-Bang Xie, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 2101:
Measurement Technology and Intelligent Instruments

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