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Proceedings Paper

Method of visual photoelectric intelligent inspection for microgeometrical parameters of surface
Author(s): Yong-Dong Pan; Dong-Sheng Li; Guang-Quan Wang
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Paper Details

Date Published: 22 September 1993
PDF: 5 pages
Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); doi: 10.1117/12.156301
Show Author Affiliations
Yong-Dong Pan, Xi'an Jiao Tong Univ. (China)
Dong-Sheng Li, Xi'an Jiao Tong Univ. (China)
Guang-Quan Wang, Xi'an Jiao Tong Univ. (China)


Published in SPIE Proceedings Vol. 2101:
Measurement Technology and Intelligent Instruments

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