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Proceedings Paper

Mathematical analysis and parameter determination of feedback-control system for the scanning tunneling microscope
Author(s): Hong-Hai Zhang; Shang-Ping Li; Gui-Jing Sun; Hanming Shi; Ri-Yao Chen
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Paper Abstract

This paper presents the mathematical analysis and parameter determination of feedback control system for a scanning tunneling microscope. We can obtain the frequency characteristics and transient response of a STM assembly for a tube scanner by its response to sine wave and square wave stimuli. In this way the optimum feedback parameters for the critically damped response can be determined. The design of the appropriate control electronics of a practical instrument is described too.

Paper Details

Date Published: 22 September 1993
PDF: 5 pages
Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); doi: 10.1117/12.156289
Show Author Affiliations
Hong-Hai Zhang, Huazhong Univ. of Science and Technology (China)
Shang-Ping Li, Huazhong Univ. of Science and Technology (China)
Gui-Jing Sun, Huazhong Univ. of Science and Technology (China)
Hanming Shi, Huazhong Univ. of Science and Technology (China)
Ri-Yao Chen, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 2101:
Measurement Technology and Intelligent Instruments

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