Share Email Print
cover

Proceedings Paper

Investigation on interference-type moire deflectometry
Author(s): Zhaoshu Liao; Ru-Shou Lu; Jingguang Tao; KunTao Yang
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A moire deflectometry without the Talbot effect is presented. A grating is replaced by interference fringes to overcome the inability of the Talbot pitch to change continuously. An additive type and a multiplicative type of moire deflectometry are described. The theory is analysed and the features are discussed with examples.

Paper Details

Date Published: 22 September 1993
PDF: 5 pages
Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); doi: 10.1117/12.156274
Show Author Affiliations
Zhaoshu Liao, Huazhong Univ. of Science and Technology (China)
Ru-Shou Lu, Huazhong Univ. of Science and Technology (China)
Jingguang Tao, Huazhong Univ. of Science and Technology (China)
KunTao Yang, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 2101:
Measurement Technology and Intelligent Instruments

© SPIE. Terms of Use
Back to Top