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Proceedings Paper

In-process tool wear and failure measurement
Author(s): Lye Huat Lee; Swee Hin Teoh; X. D. Liu
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Paper Details

Date Published: 22 September 1993
PDF: 10 pages
Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); doi: 10.1117/12.156263
Show Author Affiliations
Lye Huat Lee, Nanyang Technological Univ. (Singapore)
Swee Hin Teoh, National Univ. of Singapore (Singapore)
X. D. Liu, Nanyang Technological Univ. (Singapore)


Published in SPIE Proceedings Vol. 2101:
Measurement Technology and Intelligent Instruments

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