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Proceedings Paper

Surface-charge method and electron ray tracing on vector pipeline supercomputers
Author(s): Ryo Iiyoshi; Hiroyuki Niwa; Hideo Takematsu
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Paper Abstract

The surface charge method (SCM) is an accurate electric field solver based on the numerical integration of the charge distribution on the electrode surface. The method is suitable for the field analysis of an electron gun and lens with complicated geometry, but it becomes the most time-consuming part when electron rays are traced for the analysis of the electron optical characteristics of these devices. We have studied the SCM and the electron ray-tracing on vector pipeline supercomputers, the CRAY X-MP and the Fujitsu VP2600. On these computers, a big reduction of the computing time is obtained by the optimization of the SCM- code. This enables us to trace many electron rays for the electron beam analysis. Some applications of the optimized SCM-code for the beam analysis are also presented.

Paper Details

Date Published: 3 September 1993
PDF: 8 pages
Proc. SPIE 2014, Charged-Particle Optics, (3 September 1993); doi: 10.1117/12.155702
Show Author Affiliations
Ryo Iiyoshi, Aichi Institute of Technology (Japan)
Hiroyuki Niwa, Aichi Institute of Technology (Japan)
Hideo Takematsu, Aichi Institute of Technology (Japan)

Published in SPIE Proceedings Vol. 2014:
Charged-Particle Optics
William B. Thompson; Mitsugu Sato; Albert V. Crewe, Editor(s)

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