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Proceedings Paper

Wavelengthometry by double-refracting interferometry
Author(s): Maksymilian Pluta
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Paper Abstract

A double-refractig interference system with variable wavefront shear has been adapted to wave- lengthmetry ot nochromatic light. The interfrixige spacing is directly measured while the wavelength is read out frog a calibration plot or a data table stored in the computer mery. The proposed technique is especially suitable or aauring the peak wavelength o nocbroatic intererence filters. The measuring accuracy as good as Al = m is easily achievable.

Paper Details

Date Published: 24 September 1993
PDF: 6 pages
Proc. SPIE 1711, High-Performance Optical Spectrometry, (24 September 1993); doi: 10.1117/12.155681
Show Author Affiliations
Maksymilian Pluta, Institute of Applied Optics (Poland)


Published in SPIE Proceedings Vol. 1711:
High-Performance Optical Spectrometry
Maksymilian Pluta; Aleksandra Kopystynska; Mariusz Szyjer, Editor(s)

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