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Proceedings Paper

Two-wavelength heterodyne interferometer with extended measurement range
Author(s): E. A. Baklagin; V. V. Ridiger; P. P. Zaharov
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Paper Abstract

The article describes the circuit of a two-wavelength heterodyne interferometer operating in a spectral region of 10.6 micrometers and intended for control of the shape of the primary segment mirror of an infrared telescope. The experimental data obtained for a model of a three-element segment mirror is presented. The design of a two-wavelength interferometer to be used for aspherical mirrors testing and polished optical surfaces is proposed.

Paper Details

Date Published: 3 September 1993
PDF: 5 pages
Proc. SPIE 1978, Coherent Measuring and Data Processing Methods and Devices, (3 September 1993); doi: 10.1117/12.155052
Show Author Affiliations
E. A. Baklagin, S.I. Vavilov State Optical Institute (Russia)
V. V. Ridiger, S.I. Vavilov State Optical Institute (Russia)
P. P. Zaharov, S.I. Vavilov State Optical Institute (Russia)


Published in SPIE Proceedings Vol. 1978:
Coherent Measuring and Data Processing Methods and Devices

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