Share Email Print
cover

Proceedings Paper

Maximization of contour edge detection using adaptive thresholding
Author(s): Michelle Van Dyke-Lewis; Arthur Robert Weeks; Harley R. Myler
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A new adaptive thresholding technique is presented that maximizes the contour edge information within an image. Early work by Attneave suggested that visual information in images is concentrated at the contours. He concluded that the information associated with these points and their nearby neighbors is essential for image perception. Resnikoff has suggested a measurement of information gain in terms of direction. This measurement determines information gained from a measure of an angle direction along image contours relative to other measures of information gain for other positions along the curve. Hence, one form of information measure is the angular entropy of contours within an image. Our adaptive thresholding algorithm begins by varying the threshold value between a minimum and a maximum threshold value and then computing the total contour entropy over the entire binarized edge image. Next, the threshold value that yields the highest contour entropy is selected as the optimum threshold value. It is at this threshold value that the binarized image contains the greatest amount of image features.

Paper Details

Date Published: 3 September 1993
PDF: 8 pages
Proc. SPIE 1955, Signal Processing, Sensor Fusion, and Target Recognition II, (3 September 1993); doi: 10.1117/12.154995
Show Author Affiliations
Michelle Van Dyke-Lewis, Univ. of Central Florida (United States)
Arthur Robert Weeks, Univ. of Central Florida (United States)
Harley R. Myler, Univ. of Central Florida (United States)


Published in SPIE Proceedings Vol. 1955:
Signal Processing, Sensor Fusion, and Target Recognition II
Ivan Kadar; Vibeke Libby, Editor(s)

© SPIE. Terms of Use
Back to Top