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Proceedings Paper

Parametric study of the validity of the weak-line and strong-line limits of infrared H2O band absorption
Author(s): Pierre V. Villeneuve; Curtis H. Stern
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Paper Abstract

The goal of this research was to map the regimes of validity of the weak-line and strong-line limits as a function of temperature, pressure, and path length for the 2.7 micrometers and 6.3 micrometers H2O absorption bands. These calculations were done using an updated version of the NASA band model. A parametric study was performed where the error in assuming the validity of the two limits was calculated as a function of the physical parameters temperature, pressure, and path length. Results were generated in the form of spectral plots of the error and as band-integrated error presented in contour plots as a function of temperature and path length. Results indicate that for both bands, the weak-line error is localized in regions of intermediate temperatures and pressures at all path lengths. The strong-line limit error shows a linear increasing trend with pressure at short path lengths, while varying as a saddle-shaped function with respect to temperature and pressure at longer path lengths.

Paper Details

Date Published: 15 September 1993
PDF: 11 pages
Proc. SPIE 1968, Atmospheric Propagation and Remote Sensing II, (15 September 1993); doi: 10.1117/12.154881
Show Author Affiliations
Pierre V. Villeneuve, Virginia Polytechnic Institute and State Univ. (United States)
Curtis H. Stern, Virginia Polytechnic Institute and State Univ. (United States)


Published in SPIE Proceedings Vol. 1968:
Atmospheric Propagation and Remote Sensing II
Anton Kohnle; Walter B. Miller, Editor(s)

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