Share Email Print
cover

Proceedings Paper

Environmental bugs invade EO imaging systems
Author(s): Wendell R. Watkins
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Often electro-optical (EO) imaging systems in the thermal infrared (IR) are used for applications for which they were not originally designed. On the flip side, EO imaging systems are touted as applicable for scenarios when the magnitude of the effects of the environment (that can and do occur) have not been adequately characterized. As a result when an imaging system does not perform as expected, there is much pointing of fingers to place blame and discussion of environmental bugs (counterpart to computer bugs) getting into the equipment and fouling up the works. Some examples of these subtle problems that impact the design and use of EO imaging systems in the thermal IR are discussed in this paper, particularly the effects of optical turbulence, path radiance, and field calibration.

Paper Details

Date Published: 31 August 1993
PDF: 12 pages
Proc. SPIE 1969, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing IV, (31 August 1993); doi: 10.1117/12.154737
Show Author Affiliations
Wendell R. Watkins, U.S. Army Research Lab. (United States)


Published in SPIE Proceedings Vol. 1969:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing IV
Gerald C. Holst, Editor(s)

© SPIE. Terms of Use
Back to Top