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Proceedings Paper

Vertical MTF measurements
Author(s): Benjamin S. White; Michael J. Marquis
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Paper Abstract

A method for measuring imaging system MTF is presented that is compatible with modeling predictions as implemented in the Army's FLIR90/92 static performance model. The method uses commonly available commercial test equipment and personal computers and is effective for measuring scanning and staring array imaging systems in any imaging orientation. Testing accuracy is addressed, and simulation results are presented. Actual test data is also shown and compared with model predictions showing good agreement.

Paper Details

Date Published: 31 August 1993
PDF: 12 pages
Proc. SPIE 1969, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing IV, (31 August 1993); doi: 10.1117/12.154712
Show Author Affiliations
Benjamin S. White, Texas Instruments Inc. (United States)
Michael J. Marquis, Texas Instruments Inc. (United States)

Published in SPIE Proceedings Vol. 1969:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing IV
Gerald C. Holst, Editor(s)

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