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Proceedings Paper

EO_VISION for FLIR92 and ACQUIRE modeling
Author(s): J. R. Moulton; J. Russ Moulton; David B. Walthall; Diane E. Deterline
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Paper Abstract

EO_VISION was developed as a companion to analytical sensor models in that it provides real-time visualization of sensor processed target imbedded scenes for comparison to modeled range performance. Sensor processed scene effects are generated based upon FLIR92 sensor characterizations and ACQUIRE's environmental effects. Processed scenes containing sensor resolution sampling and noise degradation effects are generated and projected in real-time for viewing at sensor frame/field rates to determine the validity of target acquisition range performance predicted by the analytical models. The paper describes the techniques implemented with EO_VISION to simulate sensor effects to include resolution loss, filtered 1/f and broadband noise, raster forming and down-sampling. Methodology used to generate input imagery is described and representative input versus sensor processed scene prints provided. Finally, the application of EO-VISION to other tasks such as realistic perception experiments, target acquisition training, search experiments, ATR testing and imagery database management is discussed.

Paper Details

Date Published: 31 August 1993
PDF: 10 pages
Proc. SPIE 1969, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing IV, (31 August 1993); doi: 10.1117/12.154707
Show Author Affiliations
J. R. Moulton, E-OIR Measurements, Inc. (United States)
J. Russ Moulton, E-OIR Measurements, Inc. (United States)
David B. Walthall, E-OIR Measurements, Inc. (United States)
Diane E. Deterline, E-OIR Measurements, Inc. (United States)

Published in SPIE Proceedings Vol. 1969:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing IV
Gerald C. Holst, Editor(s)

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