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Proceedings Paper

X-ray beam quality effects and light diffusion modeling of screens
Author(s): David P. Trauernicht; Byron R. Sever
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Paper Abstract

The x-ray excited emission spectra of some well-known phosphor materials is examined using different x-ray beam qualities. Very thick powder samples and thinner coated screens are examined. It is observed that the emission spectra are influenced by the x-ray beam quality used if the samples are very thick. A simple light diffusion model is developed and used to understand the observed effects both qualitatively and quantitatively. It is found that very small changes in the total reflectance of the powder samples is correlated with observed spectral changes.

Paper Details

Date Published: 14 September 1993
PDF: 9 pages
Proc. SPIE 1896, Medical Imaging 1993: Physics of Medical Imaging, (14 September 1993); doi: 10.1117/12.154599
Show Author Affiliations
David P. Trauernicht, Eastman Kodak Co. (United States)
Byron R. Sever, Eastman Kodak Co. (United States)


Published in SPIE Proceedings Vol. 1896:
Medical Imaging 1993: Physics of Medical Imaging
Rodney Shaw, Editor(s)

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