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Proceedings Paper

X-ray analysis on ferroelectric and antiferroelectric liquid crystals
Author(s): Yoichi Takanishi; Asako Ikeda; Hideo Takezoe; Atsuo Fukuda
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Paper Abstract

We measured the first and the higher order Bragg peaks corresponding to the layer thickness in the SmC and SmCA phases by X-ray diffraction, and calculated the smectic order parameters of the two phases. We found that the smectic layer in the SmCA phase is much more ordered than that in the SmC phase.

Paper Details

Date Published: 13 August 1993
PDF: 7 pages
Proc. SPIE 1911, Liquid Crystal Materials, Devices, and Applications II, (13 August 1993); doi: 10.1117/12.151205
Show Author Affiliations
Yoichi Takanishi, Tokyo Institute of Technology (Japan)
Asako Ikeda, Tokyo Institute of Technology (Japan)
Hideo Takezoe, Tokyo Institute of Technology (Japan)
Atsuo Fukuda, Tokyo Institute of Technology (Japan)

Published in SPIE Proceedings Vol. 1911:
Liquid Crystal Materials, Devices, and Applications II
Uzi Efron; Michael D. Wand, Editor(s)

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