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Proceedings Paper

Incorporation of empiric values for refractive indices in multilayer design
Author(s): Z. Elgart; A. Katz-Fish; Zeev Maresse; E. Maresse
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Paper Abstract

The value of the refractive index of a thin film material in a multilayer coating is dependent both on its ordinate number in the stack and on its neighboring materials. Incorporation of such empirical data in the simulation of optical coatings narrows the gap between designed and actual coatings' performance. It makes feasible some designs which were not practical before.

Paper Details

Date Published: 13 August 1993
PDF: 5 pages
Proc. SPIE 1972, 8th Meeting on Optical Engineering in Israel: Optoelectronics and Applications in Industry and Medicine, (13 August 1993); doi: 10.1117/12.151128
Show Author Affiliations
Z. Elgart, Temmek Optics Ltd. (Israel)
A. Katz-Fish, Temmek Optics Ltd. (Israel)
Zeev Maresse, Temmek Optics Ltd. (Israel)
E. Maresse, Temmek Optics Ltd. (Israel)


Published in SPIE Proceedings Vol. 1972:
8th Meeting on Optical Engineering in Israel: Optoelectronics and Applications in Industry and Medicine

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