Share Email Print

Proceedings Paper

Spatial frequency analysis of trabecular bone radiographs
Author(s): Isaac Leichter; Victor Neeman; Emanuel Resin
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The architecture of trabecular tissue in the femoral neck plays an essential role in determining its resistance to mechanical loads. In the present study, we suggest a quantitative technique for analyzing the pattern of bone trabeculae on a conventional radiograph of the femoral neck. The method is based on optical image processing of the radiograph in order to obtain the two- dimensional power spectrum of the trabecular distribution. A one-dimensional analytic model has been developed to describe the light distribution transmitted through a region with a trabecular pattern on the radiograph. This model is able to simulate the changes which appear in the transmittance curve during the process of trabecular resorption. The resulting changes in the power spectrum of the trabecular distribution have been calculated in order to determine accurately the spectral shift which characterizes the change in the trabecular pattern. The light intensity in the Fourier plane of the optical system was analyzed to obtain experimentally the power spectrum of the trabecular pattern. The power spectrums resulting from the model were similar to those obtained by the optical Fourier Transform of the radiographs. The two dimensional power spectrum in the optical Fourier plane was analyzed in different directions. We found that different frequency range contributes to the spectrum in each direction. These results imply that optical Fourier analysis of the trabecular pattern on a conventional bone radiograph is a potential tool to characterize the structural changes occurring in the osteoporotic process.

Paper Details

Date Published: 13 August 1993
PDF: 10 pages
Proc. SPIE 1972, 8th Meeting on Optical Engineering in Israel: Optoelectronics and Applications in Industry and Medicine, (13 August 1993); doi: 10.1117/12.151122
Show Author Affiliations
Isaac Leichter, Jerusalem College of Technology (Israel)
Victor Neeman, Jerusalem College of Technology (Israel)
Emanuel Resin, Jerusalem College of Technology (Israel)

Published in SPIE Proceedings Vol. 1972:
8th Meeting on Optical Engineering in Israel: Optoelectronics and Applications in Industry and Medicine

© SPIE. Terms of Use
Back to Top