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Proceedings Paper

Background and target randomization and root mean square (RMS) background matching using a new deltaT metric definition
Author(s): Howard C. Choe; Thomas J. Meitzler; Grant R. Gerhart
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Paper Abstract

EO/IR/Laser detection of a target amidst clutter/background is a difficult problem often treated with simplistic models. Unlike noise, clutter is more complex, neither spectrally white nor statistically Gaussian. Therefore, it is insufficient to lump clutter with noise and use standard detection curves. Battelle has produced image randomization software called BATRAN (Background and Target Randomization) which computes various types of statistical distributions to randomize background and target pixels separately. The types of statistics implemented include exponential, Gaussian, log-normal, and Rice distributions for both the background and target. In an effort to identify a more robust and accurate (Delta) T metric definition for background and target matching, Battelle also developed a new (Delta) T metric definition and its equation using RMS pixel-based higher order statistics for the background and target signature pixel data in a scene image. This new (Delta) T metric provides a better estimate of true signature difference between the background/clutter and target, enabling more accurate matching of the background/clutter and target for use in sensor detection performance assessment.

Paper Details

Date Published: 13 August 1993
PDF: 14 pages
Proc. SPIE 1967, Characterization, Propagation, and Simulation of Sources and Backgrounds III, (13 August 1993); doi: 10.1117/12.151080
Show Author Affiliations
Howard C. Choe, Battelle Memorial Institute (United States)
Thomas J. Meitzler, U.S. Army Tank-Automotive Research, Development and Engineering Ctr. (United States)
Grant R. Gerhart, U.S. Army Tank-Automotive Research, Development and Engineering Ctr. (United States)


Published in SPIE Proceedings Vol. 1967:
Characterization, Propagation, and Simulation of Sources and Backgrounds III
Wendell R. Watkins; Dieter Clement, Editor(s)

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