Share Email Print

Proceedings Paper

AEDC's Scene Generation Test Capability (SGTC) using Direct Write Scene Generation (DWSG)
Author(s): Heard S. Lowry; Parker David Elrod
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A Scene Generation Test Capability (SGTC) is under development at Arnold Engineering Development Center (AEDC) which uses Direct Write Scene Generation (DWSG) as a tool to project realistic mission scenarios into sensors operating in a simulated space system environment. This capability can reduce the risk associated with developing advanced sensor systems. The second phase of this program, a Focal Plane Array Test Chamber (FPATC), is currently underway which expands the capabilities of the phase one Transportable Direct Write Scene Generator (TDWSG) reported previously. Projection wavelengths for the system include 0.514, 1.06, 5.4 and 10.6 micrometers . Multiple chamber configurations will be used to accommodate different types of test articles. The FPATC is also transportable. User testing has begun in the TDWSG. This paper will present an overview of the current SGTC program.

Paper Details

Date Published: 13 August 1993
PDF: 12 pages
Proc. SPIE 1967, Characterization, Propagation, and Simulation of Sources and Backgrounds III, (13 August 1993); doi: 10.1117/12.151076
Show Author Affiliations
Heard S. Lowry, Calspan Corp. (United States)
Parker David Elrod, Calspan Corp. (United States)

Published in SPIE Proceedings Vol. 1967:
Characterization, Propagation, and Simulation of Sources and Backgrounds III
Wendell R. Watkins; Dieter Clement, Editor(s)

© SPIE. Terms of Use
Back to Top