Share Email Print

Proceedings Paper

Rectangularly and hexagonally sampled imaging-system-fidelity analysis
Author(s): John C. Burton; Keith W. Miller; Stephen K. Park
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper provides a common mathematical framework for analyzing image fidelity losses in rectangularly and hexagonally sampled digital imaging systems. The fidelity losses considered are due to blurring during image formation, aliasing due to undersampling, and imperfect reconstruction. The analysis of the individual and combined effects of these losses is based upon an idealized, noiseless, continuous-discrete-continuous end-to-end digital imaging system model consisting of four independent system components: an input scene, an image gathering point spread function, a sampling function, and an image reconstruction function. The generalized sampling function encompasses both rectangular and hexagonal sampling lattices. Quantification of the image fidelity losses is accomplished via the mean-squared-error (MSE) metrics: imaging fidelity loss, sampling and reconstruction fidelity loss, and end-to-end fidelity loss. Shift-variant sampling effects are accounted for with an expected value analysis. This mathematical framework is used as the basis for a series of simulations comparing a regular rectangular (square) sampling grid to a regular hexagonal sampling grid for a variety of image formation and image reconstruction conditions.

Paper Details

Date Published: 27 August 1993
PDF: 12 pages
Proc. SPIE 1961, Visual Information Processing II, (27 August 1993); doi: 10.1117/12.150984
Show Author Affiliations
John C. Burton, G & A Technical Software Inc. (United States)
Keith W. Miller, College of William and Mary (United States)
Stephen K. Park, College of William and Mary (United States)

Published in SPIE Proceedings Vol. 1961:
Visual Information Processing II
Friedrich O. Huck; Richard D. Juday, Editor(s)

© SPIE. Terms of Use
Back to Top