Share Email Print
cover

Proceedings Paper

Strehl ratio meter
Author(s): Kenneth C. Widen; Richard J. Tansey
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The on axis intensity of a focused beam is a critical measurement of laser wavefront quality. This paper describes a simple method and device for measuring the Strehl ratio. The device requires a collimated beam of known input size and wavelength. The experimental Strehl ratio is determined by the power within the central 1/5 of the Airy disc diameter. Error sources are discussed, as well as experimental measurements.

Paper Details

Date Published: 13 August 1993
PDF: 6 pages
Proc. SPIE 1868, Laser Resonators and Coherent Optics: Modeling, Technology, and Applications, (13 August 1993); doi: 10.1117/12.150631
Show Author Affiliations
Kenneth C. Widen, Rockwell International Corp./Rocketdyne Div. (United States)
Richard J. Tansey, Rockwell International Corp./Rocketdyne Div. (United States)


Published in SPIE Proceedings Vol. 1868:
Laser Resonators and Coherent Optics: Modeling, Technology, and Applications
Anup Bhowmik, Editor(s)

© SPIE. Terms of Use
Back to Top