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Proceedings Paper

Application of particle image velocimetry to Mach 6 flows
Author(s): William M. Humphreys; R. A. Rallo; William W. Hunter; Scott M. Bartram; James L. Blackshire
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Paper Abstract

This paper describes particle image velocimetry measurements obtained in a Mach 6 flow field. The measurements were performed in the Langley Mach 6 High Reynolds Number Tunnel facility. A wedge model oriented at an angle-of-attack of -15 degree(s) was used to generate an oblique 22.7 degree(s) bow shock. Using 1.0-micrometer aluminum oxide powder as the seed material, PIV photographs in the vicinity of the bow shock region were taken on the centerline of the model at a location 110 mm from the leading edge. Using the two- dimensional velocity fields obtained from analysis of the photographs, normal and tangential components of velocity with respect to the shock angle were obtained. These velocity components were then used to infer the aerodynamic particle sizes present in the tunnel. Results indicated that the 1.0 micrometer seed material introduced into the tunnel had an aerodynamic size of approximately 1.0 - 2.0 micrometers. Differences were noted between the measured and predicted normal component of velocity downstream of the shock after full particle relaxation had occurred. Using qualitative flow visualization, it was determined that due to cavity flow along the test section walls, reflected shocks in the vicinity of the PIV measurements could account for these differences.

Paper Details

Date Published: 6 August 1993
PDF: 8 pages
Proc. SPIE 2052, Fifth International Conference on Laser Anemometry: Advances and Applications, (6 August 1993); doi: 10.1117/12.150545
Show Author Affiliations
William M. Humphreys, NASA Langley Research Ctr. (United States)
R. A. Rallo, NASA Langley Research Ctr. (United States)
William W. Hunter, NASA Langley Research Ctr. (United States)
Scott M. Bartram, NASA Langley Research Ctr. (United States)
James L. Blackshire, Vigyan, Inc. (United States)

Published in SPIE Proceedings Vol. 2052:
Fifth International Conference on Laser Anemometry: Advances and Applications
J. M. Bessem; R. Booij; H. W. H. E. Godefroy; P. J. de Groot; K. Krishna Prasad; F. F. M. de Mul; E. J. Nijhof, Editor(s)

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