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Proceedings Paper

Coherent object dimension measurement method with the outline images registration on a photodiode array
Author(s): Victor N. Michailov; I. V. Plechanova; L. V. Finogenov
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Paper Abstract

An optoelectronic moving object linear dimension inspection method is studied. The method is based on the outline image registration with the help of photodiode arrays operating in the signal accumulation mode. A theoretical analysis and experimental test of this method are carried out. Measurement errors of such objects as slit and roller are determined. The degree of object displacement effect on the accuracy of measurement in the measurement region is estimated.

Paper Details

Date Published: 6 August 1993
PDF: 10 pages
Proc. SPIE 2064, Machine Vision Applications, Architectures, and Systems Integration II, (6 August 1993); doi: 10.1117/12.150309
Show Author Affiliations
Victor N. Michailov, Siberian Optical Systems Research Institute (Russia)
I. V. Plechanova, Siberian Optical Systems Research Institute (Russia)
L. V. Finogenov, Siberian Optical Systems Research Institute (Russia)


Published in SPIE Proceedings Vol. 2064:
Machine Vision Applications, Architectures, and Systems Integration II
Bruce G. Batchelor; Susan Snell Solomon; Frederick M. Waltz, Editor(s)

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