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Proceedings Paper

Coarser-to-finer inspection using 3D data
Author(s): M. Arif Wani; Bruce G. Batchelor
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Paper Abstract

The paper presents a new approach to inspect the objects containing structure at different scales. The approach obtains correct descriptions of objects at a specified scale by processing it only at that scale. This feature of the technique is used to segment and inspect the coarser shape first, the results of which are then used to decide whether or not to segment and inspect the finer parts. This reduces the computational effort, and it also eliminates the need for a sophisticated segmentation technique, which may otherwise be necessary for such objects. The results on real 3-D data of a telephone instrument and a loaf of bread are presented.

Paper Details

Date Published: 6 August 1993
PDF: 9 pages
Proc. SPIE 2064, Machine Vision Applications, Architectures, and Systems Integration II, (6 August 1993); doi: 10.1117/12.150289
Show Author Affiliations
M. Arif Wani, Univ. of Wales College Cardiff (United Kingdom)
Bruce G. Batchelor, Univ. of Wales College Cardiff (United Kingdom)


Published in SPIE Proceedings Vol. 2064:
Machine Vision Applications, Architectures, and Systems Integration II
Bruce G. Batchelor; Susan Snell Solomon; Frederick M. Waltz, Editor(s)

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