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Proceedings Paper

Sequential computer algorithms for printed circuit board inspection
Author(s): Moises E. Hernandez; Jesus Rene Villalobos; W. Carrol Johnson
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Paper Abstract

Surface mounted technology (SMT) in automated assembly facilities requires the use of automatic surface-mount-device (SMD) placement machines. One of the problems involved in the electronic printed circuit board (PCB) assembly process is the verification of the SMD placement operation within tight tolerances. The high throughput of modern manufacturing lines along with the required accuracy demand the use of automatic inspection systems to verify SMD placement. Image complexity of the board makes the use of machine vision for the inspection process a difficult task. This is complicated by the fact that misclassification errors should be kept to a minimum. Additionally, it is desirable that the inspection results provide enough information to be used for statistical process control (SPC). The strategy adopted to solve this problem was to simplify the complexity of the image by means of special illumination devices. The simplified image was then suitable for analysis by simple processing, segmentation, and detection algorithms that, sequentially applied to the image, met the required repeatability and accuracy specifications for the inspection system. The scope of this paper is to describe the techniques explored by the authors to solve the SMD inspection problem in order to develop a working industrial SMD inspection system.

Paper Details

Date Published: 6 August 1993
PDF: 12 pages
Proc. SPIE 2056, Intelligent Robots and Computer Vision XII: Active Vision and 3D Methods, (6 August 1993); doi: 10.1117/12.150222
Show Author Affiliations
Moises E. Hernandez, Univ. of Texas/El Paso (United States)
Jesus Rene Villalobos, Univ. of Texas/El Paso (United States)
W. Carrol Johnson, Univ. of Texas/El Paso (United States)

Published in SPIE Proceedings Vol. 2056:
Intelligent Robots and Computer Vision XII: Active Vision and 3D Methods
David P. Casasent, Editor(s)

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