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Proceedings Paper

Automatic inspection of electronic surface-mount assemblies
Author(s): Peter Forte; Gary P Brown; Peter Barnwell; Ron Malyan; Paul Netherwood
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Paper Abstract

An approach to image analysis is described consisting of five stages: edge detection, thresholding, linking, shape description and shape abstraction. The approach is illustrated by applying the steps to the problem of automatic inspection.

Paper Details

Date Published: 20 August 1993
PDF: 7 pages
Proc. SPIE 2055, Intelligent Robots and Computer Vision XII: Algorithms and Techniques, (20 August 1993); doi: 10.1117/12.150170
Show Author Affiliations
Peter Forte, Kingston Univ. (United Kingdom)
Gary P Brown, Mercury Communications Ltd. (United Kingdom)
Peter Barnwell, Univ. of Plymouth (United Kingdom)
Ron Malyan, Kingston Univ. (United Kingdom)
Paul Netherwood, Kingston Univ. (United Kingdom)


Published in SPIE Proceedings Vol. 2055:
Intelligent Robots and Computer Vision XII: Algorithms and Techniques
David P. Casasent, Editor(s)

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