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Proceedings Paper

Design of a low-light-level image sensor with on-chip sigma-delta analog-to-digital conversion
Author(s): Sunetra K. Mendis; Bedabrata Pain; Robert H. Nixon; Eric R. Fossum
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Paper Abstract

The design and projected performance of a low-light-level active-pixel-sensor (APS) chip with semi-parallel analog-to-digital (A/D) conversion is presented. The individual elements have been fabricated and tested using MOSIS* 2 micrometers CMOS technology, although the integrated system has not yet been fabricated. The imager consists of a 128 X 128 array of active pixels at a 50 micrometers pitch. Each column of pixels shares a 10-bit A/D converter based on first-order oversampled sigma-delta ((Sigma) -(Delta) ) modulation. The 10-bit outputs of each converter are multiplexed and read out through a single set of outputs. A semi- parallel architecture is chosen to achieve 30 frames/second operation even at low light levels. The sensor is designed for less than 12 e- rms noise performance.

Paper Details

Date Published: 12 July 1993
PDF: 9 pages
Proc. SPIE 1900, Charge-Coupled Devices and Solid State Optical Sensors III, (12 July 1993); doi: 10.1117/12.148606
Show Author Affiliations
Sunetra K. Mendis, Columbia Univ. (United States)
Bedabrata Pain, Columbia Univ. (United States)
Robert H. Nixon, Jet Propulsion Lab. (United States)
Eric R. Fossum, Jet Propulsion Lab. (United States)

Published in SPIE Proceedings Vol. 1900:
Charge-Coupled Devices and Solid State Optical Sensors III
Morley M. Blouke, Editor(s)

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