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Proceedings Paper

New low-noise, random access, radiation-resistant and large-format charge-injection device (CID) imagers
Author(s): Joseph Carbone; Jeffrey J. Zarnowski; Frank S. Arnold; J. Hutton
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Paper Abstract

New low-noise CID imagers are being created to meet the demanding requirements of scientific instrumentation, high-speed tracking and nuclear inspection applications. The imagers incorporate new process technology and/or new low-noise architectures to exploit inherent unique CID features including random pixel addressability, true non-destructive pixel readout (NDRO), two-dimensional windowing (sub-array readout), and exceptional resistance to the effects of ionizing radiation. These CID features enable the user to monitor and dynamically adapt application exposure levels in real-time, reduce noise, and read out small sub-arrays of pixels at exceptionally fast rates. Due to their radiation tolerance characteristics, the devices can operate in harsh radiation environments and actually image (detect) the incoming radiation. Device formats and performance features are summarized.

Paper Details

Date Published: 12 July 1993
PDF: 11 pages
Proc. SPIE 1900, Charge-Coupled Devices and Solid State Optical Sensors III, (12 July 1993); doi: 10.1117/12.148595
Show Author Affiliations
Joseph Carbone, CID Technologies Inc. (United States)
Jeffrey J. Zarnowski, CID Technologies Inc. (United States)
Frank S. Arnold, CID Technologies Inc. (United States)
J. Hutton, CID Technologies Inc. (United States)

Published in SPIE Proceedings Vol. 1900:
Charge-Coupled Devices and Solid State Optical Sensors III
Morley M. Blouke, Editor(s)

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