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Proceedings Paper

Model for random pixel clustering in large-format CCDs
Author(s): Doug W. Donaghue
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Paper Abstract

The thermally induced charge (dark current) mechanism in CCD's gives rise to a Poisson distribution of random charge values in each pixel over the device. In the case of low radiant flux and/or quantum efficiency coupled with long integration times this may produce a large number of pixels with values significantly above or below the expected 'average' values. Such pixels in isolation usually pose no significant problem, but may be subject to misinterpretation if randomly aggregated (clustered). In many cases this is of little concern since large quantities of data are captured for subsequent analysis and these random occurrences will be recognized as such. But in the case where cost or complexity mandate 'one-shot' data capture, the question of how often such occurrences may be expected is altogether reasonable. A probabilistic model of such clustering is developed and several scenarios evaluated.

Paper Details

Date Published: 12 July 1993
PDF: 6 pages
Proc. SPIE 1900, Charge-Coupled Devices and Solid State Optical Sensors III, (12 July 1993); doi: 10.1117/12.148587
Show Author Affiliations
Doug W. Donaghue, Photometrics Ltd. (United States)

Published in SPIE Proceedings Vol. 1900:
Charge-Coupled Devices and Solid State Optical Sensors III
Morley M. Blouke, Editor(s)

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