Share Email Print

Proceedings Paper

Determination of the orientational order parameters in polysilane LB-films by measuring third-order-susceptibility tensor components
Author(s): Myoungsik Cha; Dieter Neher; F. W. Embs; Silvia Mittler-Neher; George I. Stegeman
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We demonstrate a new method for investigating the orientational distribution of the rod-like poly[bis(m-butoxyphenyl) silane] molecules in Langmuir-Blodgett (LB) films. The first two non-trivial in-plane orientational order parameters C2 and C4 could be easily deduced by measuring the independent tensor components of (chi) (3)(-(omega) 3;(omega) 1,(omega) 1,(omega) 2). Using this method, we show that the annealing process improves the molecular alignment along the dipping direction. We were also able to get information about the domain morphology of the film from the off-diagonal components of (chi) (3).

Paper Details

Date Published: 23 July 1993
PDF: 11 pages
Proc. SPIE 1852, Nonlinear Optical Properties of Advanced Materials, (23 July 1993); doi: 10.1117/12.148436
Show Author Affiliations
Myoungsik Cha, CREOL/Univ. of Central Florida (South Korea)
Dieter Neher, Max-Planck-Institut fuer Polymerforschung (Germany)
F. W. Embs, Massachusetts Institute of Technology (United States)
Silvia Mittler-Neher, Max-Planck-Institut fuer Polymerforschung (Germany)
George I. Stegeman, CREOL/Univ. of Central Florida (United States)

Published in SPIE Proceedings Vol. 1852:
Nonlinear Optical Properties of Advanced Materials
Shahab Etemad, Editor(s)

© SPIE. Terms of Use
Back to Top