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Proceedings Paper

Far-field diffraction patterns of a dot array with Gaussian random fluctuations
Author(s): Rajagopalan Uma Maheswari; Toshimitsu Asakura; Nobukatsu Takai
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Paper Abstract

A theoretical and experimental investigation on the far-field diffraction patterns of a dot array with Gaussian random fluctuations has been done quantitatively by means of a generalized fluctuation parameter. It has been found that the exposure condition strongly influences the nature of the observed photographic pattern and hence the observation of the light-depletion phenomenon first reported by Stark and later, analyzed by Martin and Aime.

Paper Details

Date Published: 12 July 1993
PDF: 12 pages
Proc. SPIE 1806, Optical Computing, (12 July 1993); doi: 10.1117/12.147823
Show Author Affiliations
Rajagopalan Uma Maheswari, Hokkaido Univ. (Japan)
Toshimitsu Asakura, Hokkaido Univ. (Japan)
Nobukatsu Takai, Hokkai-Gakuen Univ. (Japan)


Published in SPIE Proceedings Vol. 1806:
Optical Computing

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