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Proceedings Paper

Laser damage threshold measurements in Q-switch materials
Author(s): Madhu A. Acharekar; James L. Montgomery
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Paper Abstract

Materials used for electro-optics (EO) and acousto-optics (AO) Q-switches in lasers include fused silica (SiO2), lithium niobate (LiNbO3), and tellurium oxide (TeO2). The damage threshold measured for these materials is presented in this technical paper. Also, the Q-switch data collected for chromium, thulium, and holmium doped YAG (CTH:YAG) laser operating at 2.1 micrometers are reported.

Paper Details

Date Published: 24 June 1993
PDF: 11 pages
Proc. SPIE 1848, 24th Annual Boulder Damage Symposium Proceedings -- Laser-Induced Damage in Optical Materials: 1992, (24 June 1993); doi: 10.1117/12.147776
Show Author Affiliations
Madhu A. Acharekar, Schwartz Electro-Optics, Inc. (United States)
James L. Montgomery, Schwartz Electro-Optics, Inc. (United States)


Published in SPIE Proceedings Vol. 1848:
24th Annual Boulder Damage Symposium Proceedings -- Laser-Induced Damage in Optical Materials: 1992
Harold E. Bennett; Lloyd L. Chase; Arthur H. Guenther; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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