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Proceedings Paper

Investigation of the accuracy and precision of the damage-frequency method of measuring laser damage threshold
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Paper Abstract

This paper presents a defect ensemble model based analysis of the accuracy and precision of the damage frequency method (DFM) of laser damage threshold determination. The defect ensemble is used to model an optic under test and thereby gain knowledge of the true threshold. A statistical estimation of the measured damage frequencies is then derived from the binomial distribution, the defect ensemble, and the parameters of the test. The calculated test results are then analyzed using a weighted linear regression to calculate the measured threshold and its uncertainty. The difference between the true threshold and the measured threshold is a direct expression of the accuracy of the DFM. The uncertainty in the measured threshold is a measure of the precision of the DFM. The accuracy and precision of the DFM is evaluated over a range of optic and test parameters. The accuracy and precision results are combined into another figure of merit, called the measurement quality, Q(L). The resulting parametrically described Q(L) is the probability of making an accurate LDT measurement to a precision of L. It is shown that on average under most of the conditions examined, the DFM is an accurate but relatively less precise test method.

Paper Details

Date Published: 24 June 1993
PDF: 14 pages
Proc. SPIE 1848, 24th Annual Boulder Damage Symposium Proceedings -- Laser-Induced Damage in Optical Materials: 1992, (24 June 1993); doi: 10.1117/12.147440
Show Author Affiliations
Jonathan W. Arenberg, TRW Space and Technology Group (United States)


Published in SPIE Proceedings Vol. 1848:
24th Annual Boulder Damage Symposium Proceedings -- Laser-Induced Damage in Optical Materials: 1992
Harold E. Bennett; Lloyd L. Chase; Arthur H. Guenther; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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