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Proceedings Paper

Effect of laser irradiation conditions on the optical damage resistance of dielectric coatings
Author(s): A. V. Belotserkovets; A. V. Bessarab; Gennadi A. Kirillov; Y. V. Kuratov; D. V. Pavlov; V. T. Punin
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Paper Abstract

We report the measured damage thresholds of dielectric coatings of optical elements in the 120 TW iodine laser system ISKRA-5 when irradiated by pulses with approximately 0.5 ns duration at 1315 nm. The main part of high-reflection coatings is characterized by the damage thresholds from 10 to 30 J/cm2. The damage thresholds of antireflection coatings for most components are significantly lower, namely: from 3 to 8 J/cm2. It has been shown that the damage resistance of high-reflection coatings is greatly dependent on whether the coating is on the entrance or exit surface to radiation, whereas for antireflection coatings and quarter-wave SiO2 films such dependence is practically absent. The damage threshold of polarization coatings depends on radiation polarization. The obtained results are explained by a mechanism connected with a preferential concentration of absorbing defects, causing damage at the boundary of a coating and substrate.

Paper Details

Date Published: 24 June 1993
PDF: 5 pages
Proc. SPIE 1848, 24th Annual Boulder Damage Symposium Proceedings -- Laser-Induced Damage in Optical Materials: 1992, (24 June 1993); doi: 10.1117/12.147404
Show Author Affiliations
A. V. Belotserkovets, All-Russian Research Institute of Experimental Physics (Russia)
A. V. Bessarab, All-Russian Research Institute of Experimental Physics (Russia)
Gennadi A. Kirillov, All-Russian Research Institute of Experimental Physics (Russia)
Y. V. Kuratov, All-Russian Research Institute of Experimental Physics (Russia)
D. V. Pavlov, All-Russian Research Institute of Experimental Physics (Russia)
V. T. Punin, All-Russian Research Institute of Experimental Physics (Russia)


Published in SPIE Proceedings Vol. 1848:
24th Annual Boulder Damage Symposium Proceedings -- Laser-Induced Damage in Optical Materials: 1992
Harold E. Bennett; Lloyd L. Chase; Arthur H. Guenther; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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