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Proceedings Paper

Step-stress and life testing of multiemitter bar lasers
Author(s): Thomas H. Faltus
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Paper Abstract

The lifetime potential of many electro-optic components is often given in literature and product data sheets based on unstated or, at best, very restricted operating conditions. Often, because of the high cost of test devices, life test equipment and the cost of conducting life tests, lifetime data is available over only limited operating ranges. Extending the operating ranges is attempted only if applications for the component demand it. This paper presents a test methodology that first establishes the maximum operating stress levels for laser devices. And then, an Experimental Design Methodology is used to model laser device lifetime as a function of those operating stresses. Adopting the intent of Test Method 5006 (Limit Testing) of MIL-STD-883, Step-Stress Operational Life Tests were conducted to 'establish the operational stress levels that will accelerate predominant failure mechanisms' for multi-emitter bar lasers. An eight cell step-stress test matrix was completed. The matrix consisted of stepping individual operating stresses while driving bar lasers in either a constant peak current or a constant peak power mode. This paper presents the results of the step-stress test matrix and provides the maximum operating stress levels for these components.

Paper Details

Date Published: 16 June 1993
PDF: 12 pages
Proc. SPIE 1850, Laser Diode Technology and Applications V, (16 June 1993); doi: 10.1117/12.146910
Show Author Affiliations
Thomas H. Faltus, McDonnell Douglas Electronic Systems Co. (United States)


Published in SPIE Proceedings Vol. 1850:
Laser Diode Technology and Applications V
Daniel Renner, Editor(s)

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