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Proceedings Paper

Stand-alone atomic force microscope featuring large, scan friction measurement, atomic resolution, and capability of liquid operation
Author(s): Constant A.J. Putman; Kees O. van der Werf; Bart G. de Grooth; Niko F. van Hulst; Jan Greve
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Paper Abstract

We have developed a stand-along atomic force microscope featuring large scan, friction measurement, atomic resolution and capability of in liquid operation. Cantilever displacements are detected with optical beam deflection. Cantilever and laser diode are both attached at the piezo tube and thus scanned simultaneously. As a direct consequence the maximum scan range, 25 X 25 micrometers 2, is solely determined by the characteristics of the piezo tube and not by the dimensions of the cantilever and/or the waist of the laser beam. The stand- along atomic force microscope is suitable to be combined with any inverted optical microscope (including the confocal laser scanning microscope), as is illustrated with fluorescence and height images of K562-cells. Results on thin films consisting of a mixture of polymers show the strength of measuring friction and height simultaneously. Images of mica show that atomic resolution can be obtained both in height and friction mode.

Paper Details

Date Published: 4 June 1993
PDF: 7 pages
Proc. SPIE 1855, Scanning Probe Microscopies II, (4 June 1993); doi: 10.1117/12.146378
Show Author Affiliations
Constant A.J. Putman, Univ. of Twente (Netherlands)
Kees O. van der Werf, Univ. of Twente (Netherlands)
Bart G. de Grooth, Univ. of Twente (Netherlands)
Niko F. van Hulst, Univ. of Twente (Netherlands)
Jan Greve, Univ. of Twente (Netherlands)


Published in SPIE Proceedings Vol. 1855:
Scanning Probe Microscopies II
Clayton C. Williams, Editor(s)

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