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Proceedings Paper

High-resolution scanning Hall probe microscopy
Author(s): Hans D. Hallen; H. F. Hess; A. M. Chang; Loren N. Pfeiffer; Kenneth W. West; David B. Mitzi
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Paper Abstract

A high resolution scanning Hall probe microscope is used to spatially resolve vortices in high temperature superconducting Bi2Sr2CaCu2O8+(delta) crystals. We observe a partially ordered vortex lattice at several different applied magnetic fields and temperatures. At higher temperatures, a limited amount of vortex re-arrangement is observed, but most vortices remain fixed for periods long compared to the imaging time of several hours even at temperatures as high as 75 degree(s)K (the superconducting transition temperature for these crystals is approximately 84 degree(s)K). A measure of these local magnetic penetration depth can be obtained from a fit to the surface field of several neighboring vortices, and has been measured as a function of temperature. In particular, we have measured the zero temperature penetration depth and found it to be 275 +/- 40 nm.

Paper Details

Date Published: 4 June 1993
PDF: 6 pages
Proc. SPIE 1855, Scanning Probe Microscopies II, (4 June 1993); doi: 10.1117/12.146371
Show Author Affiliations
Hans D. Hallen, AT&T Bell Labs. (United States)
H. F. Hess, AT&T Bell Labs. (United States)
A. M. Chang, AT&T Bell Labs. (United States)
Loren N. Pfeiffer, AT&T Bell Labs. (United States)
Kenneth W. West, AT&T Bell Labs. (United States)
David B. Mitzi, IBM Corp. (United States)

Published in SPIE Proceedings Vol. 1855:
Scanning Probe Microscopies II
Clayton C. Williams, Editor(s)

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