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Proceedings Paper

Scanning tunneling and force microscopies of low-dimensional organic conductors and superconductors
Author(s): Raul Fainchtein; S. T. D'Arcangelis; S. S. Yang; D. O. Cowan; Sangyol Yoon; S. H. Pan; W. F. Smith; M. Yoo; Alejandro L. de Lozanne
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Paper Abstract

Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) have been successfully applied to investigate the surface structure and the electron density of states of organic conductors and superconductors. The structural nature of organic conductors and superconductors makes their transport properties susceptible to one-dimensional effects. Low- dimensionality effects in the electrical conductivity of these materials are investigated using scanning tunneling microscopy at room and low temperatures. Effects such as charge density waves and Peierls instabilities are directly observed with the STM. The consequences of low- dimensionality in the electrical conductivity of these materials will be presented.

Paper Details

Date Published: 4 June 1993
PDF: 11 pages
Proc. SPIE 1855, Scanning Probe Microscopies II, (4 June 1993); doi: 10.1117/12.146369
Show Author Affiliations
Raul Fainchtein, Johns Hopkins Univ. (United States)
S. T. D'Arcangelis, Johns Hopkins Univ. (United States)
S. S. Yang, Johns Hopkins Univ. (United States)
D. O. Cowan, Johns Hopkins Univ. (United States)
Sangyol Yoon, Univ. of Texas/Austin (United States)
S. H. Pan, Univ. of Texas/Austin (United States)
W. F. Smith, Univ. of Texas/Austin (United States)
M. Yoo, Univ. of Texas/Austin (United States)
Alejandro L. de Lozanne, Univ. of Texas/Austin (United States)

Published in SPIE Proceedings Vol. 1855:
Scanning Probe Microscopies II
Clayton C. Williams, Editor(s)

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