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Proceedings Paper

Imaging modes and contrast in near-field scanning optical microscopy
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Paper Abstract

Near field scanning optical microscopy (NSOM) provides a number of unique capabilities for high resolution imaging. In this regard, a fundamental aspect of the technique is its ability to retain much of the characteristics available in diffraction limited optical probing. Results are presented on the use of near field scanning optical microscopy (NSOM) in imaging a variety of samples, using different contrast mechanisms. The approaches adopted are based on the recently introduced simultaneous, non-contact, near field optical microscope with atomic force regulation. Amongst the techniques discussed are linearized polarizing microscopy, as well as amplitude, and phase, interference contrast imaging modalities.

Paper Details

Date Published: 4 June 1993
PDF: 8 pages
Proc. SPIE 1855, Scanning Probe Microscopies II, (4 June 1993); doi: 10.1117/12.146364
Show Author Affiliations
Ricardo Toledo-Crow, Rochester Institute of Technology (United States)
Mehdi Vaez-Iravani, Rochester Institute of Technology (United States)

Published in SPIE Proceedings Vol. 1855:
Scanning Probe Microscopies II
Clayton C. Williams, Editor(s)

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