Share Email Print

Proceedings Paper

Reflection shear force/reflection near-field scanning optical microscopy
Author(s): Patrick J. Moyer; Michael A. Paesler
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The spatial resolution afforded by near-field scanning optical microscopy (NSOM) is primarily a function of tip size and tip-sample separation. Combining scanning force microscopy with NSOM allows one to maintain a small tip-sample separation distance and, consequently, optimize NSOM resolution. This provides, simultaneously, a topographic perspective of the sample as well as an NSOM image. We present, in this paper, an instrument that provides simultaneous shear force and reflection NSOM images. We also incorporate a tip deflection detection scheme that allows the force signal to be completely decoupled from the optical signal. In order to accurately analyze the NSOM images, it is important to understand the feedback mechanism so that proper image deconvolution can be performed. Considerations concerning the forces measured are made. A discussion concerning Raman scattering capabilities in this regime is also provided, along with some preliminary Raman data.

Paper Details

Date Published: 4 June 1993
PDF: 9 pages
Proc. SPIE 1855, Scanning Probe Microscopies II, (4 June 1993); doi: 10.1117/12.146363
Show Author Affiliations
Patrick J. Moyer, North Carolina State Univ. (United States)
Michael A. Paesler, North Carolina State Univ. (United States)

Published in SPIE Proceedings Vol. 1855:
Scanning Probe Microscopies II
Clayton C. Williams, Editor(s)

© SPIE. Terms of Use
Back to Top