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Proceedings Paper

High-speed imaging for flash radiography using PIN diodes
Author(s): Grant J. Lockwood; Luke B. Bishop; Michael M. Selph
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Paper Abstract

A high speed readout imaging system utilizing a commercial flash x-ray machine and miniature x-ray detectors has been developed. This system was designed to operate in the environment near a nuclear detonation where film or camera imaging cannot be used. The temporal resolution of the system is set by the 20 nanosecond FWHM of the x-ray pulse. The spatial resolution of the system was determined by the size and close packing of the PIN diodes used as the x-ray detectors. In the array used here, the PIN diodes have an active area of 2 mm in diameter and were placed 3.8 mm center to center. Computer-generated images using algorithms developed for this system are presented and compared with an image captured on film in the laboratory.

Paper Details

Date Published: 1 January 1993
PDF: 9 pages
Proc. SPIE 1801, 20th International Congress on High Speed Photography and Photonics, (1 January 1993); doi: 10.1117/12.145819
Show Author Affiliations
Grant J. Lockwood, Sandia National Labs. (United States)
Luke B. Bishop, Sandia National Labs. (United States)
Michael M. Selph, Sandia National Labs. (United States)

Published in SPIE Proceedings Vol. 1801:
20th International Congress on High Speed Photography and Photonics
John Marks Dewey; Roberto G. Racca, Editor(s)

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