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Proceedings Paper

Soft x-ray time-resolved spectroscopy
Author(s): Hai Zhang; Qin Lao Yang; B. P. Guo; Hanben Niu; Jingzhen Li; Yun Cai Wang; Zhong Xian F. Song; Zhongben L. Liu
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Paper Abstract

The soft x-ray time-resolved spectroscopy is composed of a soft x-ray spectroscopic head and a soft x-ray streak camera. Because the soft x-ray spectroscopic head possesses a spectral resolution of 0.1 angstrom, the performances of the whole system mainly depend on the characteristics of the soft x-ray streak camera. In this paper, therefore, the design features and characterization of the soft x-ray streak camera are mainly described. In order to record the spectrum ranging from 30 angstroms to 230 angstroms on a limited photocathode slit length, the whole camera including the photocathode can be shifted along the spectrum without dismantling the camera from the soft x-ray generating chamber. The soft x-ray streak image tube possesses a specially designed vacuum-tight valve, which could be closed or opened in the vacuum chamber operated by a step motor, to prevent the photocathode sensitive to soft x- ray and internal intensified microchannel plate from pollution by water vapor or dust in the atmosphere. In order to test its dynamic performances, a soft x-ray diode was developed. The dynamic testing shows that the temporal resolution of this camera is 5 ps, which is limited by our soft x-ray source, dynamic spatial resolution is 20 lp/mm which implies the spectral resolution of 0.25 angstroms. Because of using CsI or KI photocathode deposited on a 1000 angstrom thick parylence film, the spectral responses range is approximately 0.05 to 10 KeV.

Paper Details

Date Published: 1 January 1993
PDF: 8 pages
Proc. SPIE 1801, 20th International Congress on High Speed Photography and Photonics, (1 January 1993); doi: 10.1117/12.145804
Show Author Affiliations
Hai Zhang, Xi'an Institute of Optics and Precision Mechanics (China)
Qin Lao Yang, Xi'an Institute of Optics and Precision Mechanics (China)
B. P. Guo, Xi'an Institute of Optics and Precision Mechanics (China)
Hanben Niu, Xi'an Institute of Optics and Precision Mechanics (China)
Jingzhen Li, Xi'an Institute of Optics and Precision Mechanics (China)
Yun Cai Wang, Xi'an Institute of Optics and Precision Mechanics (China)
Zhong Xian F. Song, Xi'an Institute of Optics and Precision Mechanics (China)
Zhongben L. Liu, Xi'an Institute of Optics and Precision Mechanics (China)


Published in SPIE Proceedings Vol. 1801:
20th International Congress on High Speed Photography and Photonics
John Marks Dewey; Roberto G. Racca, Editor(s)

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