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Proceedings Paper

Planar waveguides fabricated by proton irradiation in quartz silica
Author(s): A. V. Tomov; L. M. Shteyngart; V. P. Red'ko; Anton V. Malko
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Paper Abstract

Parameters of refractive-index profile, the birefringence value, and mode interference pattern of buried planar waveguides fabricated by proton irradiation with doses from 1014 to 1017 cm-2 have been investigated experimentally. It has been shown that the Epsteyn model is a good approximation of waveguide refractive-index profile. The mechanical stress distribution in such waveguide layers has been studied by optical methods. A method for reconstructing the radiation induced defect distribution in the collision region has been proposed. The value of the proportionality factor in the refractive-index increment dependence on dose was determined more exactly on the basis of experimental data. Changes of the waveguide parameters dependent on the temperature of isochronous annealing also have been investigated.

Paper Details

Date Published: 14 May 1993
PDF: 14 pages
Proc. SPIE 1932, Guided-Wave Optics, (14 May 1993); doi: 10.1117/12.145596
Show Author Affiliations
A. V. Tomov, Institute of Applied Optics (Belarus)
L. M. Shteyngart, Institute of Applied Optics (Belarus)
V. P. Red'ko, Institute of Applied Optics (Belarus)
Anton V. Malko, Institute of Applied Optics (Belarus)


Published in SPIE Proceedings Vol. 1932:
Guided-Wave Optics

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